Willem van Driel

Publications

  1. Exploring water and ion transport process at silicone/copper interfaces using in-situ electrochemical and Kelvin probe approaches
    B. Munirathinam; J.P.B. van Dam; A. Herrmann; W.D. van Driel; F. De Buyl; S.J.F. Erich; L.G.J. van der Ven; O.C.G. Adan; J.M.C. Mol;
    Journal of Materials Science & Technology,
    Volume 64, pp. 203 - 213, 2021. SI: Advanced Corrosion-Resistant Materials and Emerging Applications. DOI: https://doi.org/10.1016/j.jmst.2019.07.044
    document

  2. Correction: The inactivation mechanism of chemical disinfection against SARS-CoV-2: from MD and DFT perspectives
    Tan, Chunjian; Gao, Chenshan; Zhou, Quan; Van Driel, Willem; Ye, Huaiyu; Zhang, GuoQi;
    RSC Adv.,
    Volume 11, pp. 3509-3509, 2021. DOI: 10.1039/D0RA90127J
    document

  3. Facile Synthesis of Ag Nanowire/TiO2 and Ag Nanowire/TiO2/GO Nanocomposites for Photocatalytic Degradation of Rhodamine B
    Hajipour, Pejman; Bahrami, Abbas; Mehr, Maryam Yazdan; van Driel, Willem Dirk; Zhang, GuoQi;
    Materials,
    Volume 14, Issue 4, 2021. DOI: 10.3390/ma14040763
    document

  4. Prediction of software reliability
    W. van Driel; J.W. Bikker; M. Tijink;
    Microelectronics Reliability,
    Volume 119, pp. 114074, 2021. DOI: https://doi.org/10.1016/j.microrel.2021.114074
    document

  5. System level reliability assessment for high power light-emitting diode lamp based on a Bayesian network method
    Mesfin Seid Ibrahim; Jiajie Fan; Winco K.C. Yung; Zhou Jing; Xuejun Fan; Willem van Driel; Guoqi Zhang;
    Measurement,
    Volume 176, pp. 109191, 2021. DOI: https://doi.org/10.1016/j.measurement.2021.109191
    document

  6. The influence of phosphor particles on the water transport in optical silicones for LEDs
    A. Herrmann; S.J.F. Erich; L.G.J. v.d. Ven; H.P. Huinink; W.D. van Driel; M.van Soestbergen; A. Mavinkurve; F. Deuyl; J.M.C. Mol; O.C.G. Adan;
    Optical Materials: X,
    Volume 6, pp. 100047, 2020. DOI: https://doi.org/10.1016/j.omx.2020.100047

  7. Towards Multi-Functional SiO2@YAG:Ce Core–Shell Optical Nanoparticles for Solid State Lighting Applications
    Mahdi Kiani Khouzani; Abbas Bahrami; Maryam Yazdan Mehr; Willem Dirk van Driel; GuoQi Zhang;
    Nanomaterials,
    Volume 10, Issue 1, pp. 153, 2020. DOI: https://doi.org/10.3390/nano10010153

  8. Software Reliability for Agile Testing
    Willem Dirk van Driel; Jan Willem Bikker; Matthijs Tijink; Alessandro Di Bucchianico;
    Mathematics,
    Volume 8, Issue 5, pp. 791, 2020. DOI: https://doi.org/10.3390/math8050791

  9. Machine Learning and Digital Twin Driven Diagnostics and Prognostics of Light‐Emitting Diodes
    Mesfin Seid Ibrahim; Jiajie Fan; Winco K. C. Yung; Alexandru Prisacaru; Willem D. van Driel; Xuejun Fan; GuoQi Zhang;
    Laser and Photonics Reviews,
    Volume 14, Issue 12, Dec 2020. DOI: 10.1002/lpor.202000254
    document

  10. The inactivation mechanism of chemical disinfection against SARS-CoV-2: from MD and DFT perspectives
    Tan, Chunjian; Gao, Chenshan; Zhou, Quan; Van Driel, Willem; Ye, Huaiyu; Zhang, GuoQi;
    RSC Adv.,
    Volume 10, pp. 40480-40488, 2020. DOI: 10.1039/D0RA06730J
    document

  11. Sensor Systems Simulations: From Concept to Solution
    van Driel, W. D.; Pyper, O.; Schumann, C. (Ed.);
    Springer, , 2020. DOI: https://doi.org/10.1007/978-3-030-16577-2

  12. Ultraviolet Sensing in WBG: SiC
    Brahim el Mansouri; W.D. van Driel; GuoQi Zhang;
    Springer, , pp. 397-425, 2020.

  13. From Si Towards SiC Technology for Harsh Environment Sensing
    L. M. Middelburg; W. D. van Driel; GuoQi Zhang;
    Springer International Publishing, , 2020. DOI: 10.1007/978-3-030-16577-2_1
    document

  14. Health Monitoring for Lighting Applications
    W. D. van Driel; L. M. Middelburg; B. El Mansouri; B. J. C. Jacobs;
    Springer, , 2020.

  15. System Software Reliability
    Willem D. Van Driel; J.W. Bikker; M. Tijink;
    In 2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    pp. 1-5, July 2020. DOI: 10.1109/EuroSimE48426.2020.9152686

  16. High-resolution MEMS inertial sensor combining large-displacement buckling behaviour with integrated capacitive readout
    Brahim El Mansouri; Luke M. Middelburg; Rene H. Poelma; GuoQi Zhang; Henk W. van Zeijl; Jia Wei; Hui Jiang; Johan G. Vogel; Willem D. van Driel;
    Microsystems & Nanoengineering,
    Volume 5, 2019.
    document

  17. Degradation of optical materials in solid-state lighting systems
    Yazdan Mehr, M.; Bahrami, A.; van Driel, W. D.; Fan, X. J.; Davis, J. L.; GuoQi Zhang;
    International Materials Reviews,
    2019. DOI: https://doi.org/10.1080/09506608.2019.1565716

  18. Degradation of bisphenol-a-polycarbonate (BPA-PC) optical lenses under simulated harsh environment conditions
    Mehr, M. Y.; Van Driel, W.; GuoQi Zhang;
    In 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2019,
    2019. DOI: https://doi.org/10.1109/EuroSimE.2019.8724524

  19. A review on discoloration and high accelerated testing of optical materials in LED based-products
    M. Yazdan Mehr; M.R. Toroghinejad; F. Karimzadeh; W.D. van Driel; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 81, pp. 136-142, 2018.

  20. A stochastic process based reliability prediction method for LED driver
    Bo Sun; Xuejun Fan; Willem van Driel; Chengqiang Cui; GuoQi Zhang;
    Reliability Engineering and System Safety,
    Volume 178, pp. 140-146, 2018.

  21. Study on the Degradation of Optical Silicone Exposed to Harsh Environments
    Yazdan Mehr, M.; van Driel, W.; De Buyl, F.; GuoQi Zhang;
    Materials,
    2018. DOI: https://doi.org/10.3390/ma11081305

  22. Special issue: International conference on thermal, mechanical & multiphysics simulation and experiments in micro- and nano-electronics and systems [EuroSimE2017]
    van Driel, W. D.; Wymyslowski, A.;
    Microelectronics Reliability,
    2018. DOI: https://doi.org/10.1016/j.microrel.2018.06.012

  23. Quality and Reliability in Solid-State Lighting: Qua Vadis?
    Vos, T; den Breeijen, P.; van Driel, W. D.;
    Solid State Lighting Reliability Part 2: Components to Systems,
    2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_1

  24. Solid State Lighting Reliability Part 2: Components to Systems
    van Driel, W. (ed.); Fan, X. (ed.); Zhang, G. Q. (ed.) (Ed.);
    Springer International Publishing AG, , 2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_1_16

  25. Lightning Effects on LED-Based Luminaires
    Agbemuko, A.; van Meurs, J.; van Driel, W. D.;
    Springer International Publishing, , pp. 573-583, 2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_21

  26. Reliability Prediction of Integrated LED Lamps with Electrolytic Capacitor-Less LED Drivers
    Bo Sun; Fan, X.; van Driel, W. D. (ed.); GuoQi Zhang;
    Springer, , 2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_16

  27. The Next Frontier: Reliability of Complex Systems
    Schenkelaars, D.; van Driel, W. D. (ed.); Duijve, R.;
    Springer International Publishing AG, , 2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_22

  28. Statistical Analysis of Lumen Depreciation for LED Packages
    Schuld, M.; van Driel, W. D. (ed.); Jacobs, B.;
    Springer International Publishing, , 2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_17

  29. LED-Based Luminaire Color Shift Acceleration and Prediction
    Lu, G.; van Driel, W. D. (ed.); Fan, X.; Fan, J.; GuoQi Zhang;
    Springer, , pp. 201-219, 2018. DOI: https://doi.org/10.1007/978-3-319-58175-0_9

  30. Reliability and Lifetime Assessment of Optical Materials in LED-Based Products
    Maryam Yazdan Mehr; Willem Dirk van Driel; GuoQi Zhang;
    In Solid State Lighting Reliability Part 2,
    Springer, 2018.

  31. Corrosion Sensitivity of LED Packages
    B.J.C. Jacobs; C. van der Marel; W.D. van Driel; S.J. Lu; X.P. Li;
    In Solid State Lighting Reliability Part 2: Components to Systems,
    Springer International Publishing AG, 2018.

  32. Designing a 100 [aF/nm] capacitive transducer
    L. M. Middelburg; B. El Mansouri; R. H. Poelma; H. W. van Zeijl; Jia Wei; GuoQi Zhang; W. D. van Driel;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
    2018.

  33. Lumen maintenance prediction for LEDs: New insights
    Jacobs, B.; van Driel, W. D.; Schuld, M.;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018. Piscataway, NJ: IEEE,
    pp. 1-4, 2018. DOI: https://doi.org/10.1109/EuroSimE.2018.8369895

  34. Color maintenance prediction for LED-based products
    W.D. van Driel; J.G.J. Beijer; J.W. Bikker; C.H.M. van Blokland; C. Ankomah B. Jacobs;
    In 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018,
    2018.

  35. Color shift acceleration on mid-power LED packages
    Guangjun Lu; Driel, W.D. van; Xuejun Fan; Jiajie Fan; Cheng Qian; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 78, Issue Supplement C, pp. 294 -- 298, 11 2017. DOI: 10.1016/j.microrel.2017.09.014
    Keywords: ... Color shift, Mid-power LED package, Temperature stress, Current stress, Humidity stress.

  36. Effects of Graphene Monolayer Coating on the Optical Performance of Remote Phosphors
    Maryam Yazdan Mehr; S. Vollebregt; W. D. van Driel; GuoQi Zhang;
    Journal of Electronic Materials,
    Volume 46, Issue 10, pp. 5866--5872, 2017. DOI: 10.1007/s11664-017-5592-8
    Keywords: ... graphene, Light-emitting diode, reliability, remote phosphor.

  37. Reliability and diffusion-controlled through thickness oxidation of optical materials in LED-based products
    Yazdan Mehr, M.; M.R. Toroghinejad; F. Karimzadeh; van Driel, W.D.; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 78, pp. 143--147, 2017. DOI: 10.1016/j.microrel.2017.08.014
    Keywords: ... BPA-PC, LED-based products, Optics, Oxidation, Yellowing.

  38. A Reliability Prediction for Integrated LED Lamp With Electrolytic Capacitor-Free Driver
    Bo Sun; X Fan; L Li; H Ye; W van Driel; GuoQi Zhang;
    IEEE Transactions on Components and Packaging and Manufacturing Technology,
    Volume 7, Issue 7, pp. 1081-1088, 2017.

  39. A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation
    Bo Sun; X Fan; H Ye; J Fan; C Qian; W van Driel; GuoQi Zhang;
    Reliability Engineering & System Safety,
    Volume 163, pp. 14-21, 2017.

  40. Prognostics \& health management for LED-based applications
    W.D. van Driel; B. Jacobs; D. Schenkelaars; M. Klompenhouwer; R. Poelma; B. El Mansouri; L.M. Middelburg;
    In Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2017 18th International Conference on,
    2017.

  41. Smart Systems Integration in the era of Solid State Lighting
    GuoQi Zhang; H. van Zeijl; W.D. van Driel; R. Poelma; Z.K. Esfahani; M.R. Venkatesh; L. Middelburg; B. El Mansouri;
    In Smart System Integration conference (SSI),
    2017.

  42. LED degradation: From component to system
    B. Hamon; van Driel, Willem;
    Microelectronics Reliability,
    Volume 64, pp. 599--604, 9 2016. DOI: DOI: 10.1016/j.microrel.2016.07.014

  43. Lumen maintenance predictions for LED packages
    van Driel, Willem; M Schuld; B. Jacobs; F. Commissaris; van der Eyden, J; B. Hamon;
    Microelectronics Reliability,
    Volume 62, pp. 39--44, 3 2016. DOI: https://doi.org/10.1016/j.microrel.2016.03.018

  44. Creep fatigue models of solder joints: A critical review
    E.H. Wong; van Driel, Willem; A. Dasgupta; M. Pecht;
    Microelectronics Reliability,
    Volume 59, pp. 186--194, 1 2016.

  45. Colour shift and mechanism investigation on the PMMA diffuser used in LED-based luminaires
    G Lu; van Driel, WD; Xuejun Fan; Yazdan Mehr, M; Jiajie Fan; Cheng Qian; KMB Jansen; GQ Zhang;
    Optical Materials,
    Volume 54, pp. 282--287, 2016. harvest. DOI: 10.1016/j.optmat.2016.02.023
    Keywords: ... Colour shift, PMMA, Solid state lighting, LED-based luminaire, Infrared absorption spectroscopy.

  46. A Systematic Approach for Reliability Assessment of Electrolytic Capacitor-Free LED Drivers
    Bo Sun; Xuejun Fan; van Driel, Willem; GuoQi Zhang;
    United States: IEEE, , pp. 1--5, 4 2016. DOI: 10.1109/EuroSimE.2016.7463387
    Keywords: ... Reliability, MOSFET, Electrolytic Capacitor-Free LED Driver.

  47. Lumen Decay Prediction in LED Lamps
    Bo Sun; Xuejun Fan; van Driel, Willem; Thomas Michel; Jiang Zhou; GuoQi Zhang;
    United States: IEEE, , pp. 1--5, 4 2016. DOI: 10.1109/EuroSimE.2016.7463391
    Keywords: ... Reliability, LED Lamp, Lumen Decay Prediction.

  48. Reinforced structure for a stack of layers in a semiconductor component
    HP Hochstenbach; van Driel, Willem;
    10 2016.

  49. Degradation of Microcellular PET Reflective Materials Used in LED-based Products
    Guangjun Lu; W.D. van Driel; Xuejun Fan; M. Yazdan Mehr; Jiajie Fan; K.M.B. Jansen; GuoQi Zhang;
    Optical Materials,
    Volume 49, pp. 79-84, 2015.

  50. Color shift investigations for LED secondary optical designs: Comparison between BPA-PC and PMMA
    Guangjun Lu; M. Yazdan Mehr; W.D. van Driel; Xuejun Fan; Jiajie Fan; K.M.B. Jansen; GuoQi Zhang;
    Optical Materials,
    Volume 45, pp. 37-41, 2015.

  51. Surface aspects of discolouration in Bisphenol A Polycarbonate (BPA-PC), used as lens in LED-based products
    Maryam Yazdan Mehr; W. D. van Driel; H. Udono; GuoQi Zhang;
    Optical Materials,
    Volume 37, pp. 155-159, 2014.

  52. Reliability and optical properties of LED lens plates under high temperature stress
    Maryam Yazdan Mehr; van Driel, WD; Koh, SW; GuoQi Zhang;
    Microelectronics Reliability,
    2014.

  53. Lifetime assessment of Bisphenol-A Polycarbonate (BPA-PC) plastic lens, used in LED-based products
    Maryam Yazdan Mehr; van Driel, WD; Jansen, KMB; Deeben, P; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 54, Issue 1, pp. 138-142, 2014.

  54. Accelerated life time testing and optical degradation of remote phosphor plates
    Maryam Yazdan Mehr; van Driel, WD; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 54, Issue 8, pp. 1544-1548, 2014.

  55. Multi-physics reliability simulation for solid state lighting drivers
    Tarashioon, S; van Driel, WD; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 54, Issue 6-7, pp. 1212-1222, 2014.

  56. Fracture toughness of Cu-EMC interfaces in pressurized steam
    Sadeghinia, M; Jansen, KMB amd Ernst, LJ; Pape, H; Maus, I; van Driel, WD; GuoQi Zhang;
    International Journal of Adhesion and Adhesives,
    Volume 49, pp. 73-79, 2014.

  57. Establishment of the Mesoscale Parameters for Separation: A Nonequilibrium Molecular Dynamics Model
    Cell K. Y. Wong; S. Y. Y. Leung; R. H. Poelma; K. M. B. Jansen; C. C. A. Yuan; W. D. van Driel; GuoQi Zhang;
    In Molecular Modeling and Multiscaling Issues for Electronic Material Applications,
    Springer, 2014.

  58. Reliability of LED-based Products is a Matter of Balancing Temperatures
    Maryam Yazdan Mehr; W.D. van Driel; GuoQi Zhang;
    In Therminic Conference,
    2014.

  59. Colour shift in remote phosphor based LED products
    Maryam Yazdan Mehr; Driel, WD van; GuoQi Zhang;
    In Proceedings - 64th Electronic Components and Technology Conference,
    pp. 1477-1481, 2014.

  60. Reliability and accelerated test methods for plastic materials in LED-based products
    Maryam Yazdan Mehr; van Driel, WD; GuoQi Zhang;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-5, 2014.

  61. Investigation of color shift of LEDs-based lighting products
    Koh, SW; Huaiyu Ye; Maryam Yazdan Mehr; Jia Wei; van Driel, WD; Zhao, LB; GuoQi Zhang;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-5, 2014.

  62. Software reliability and its interaction with hardware reliability
    van Driel, WD; Schuld, M; Wijgers, R; van Kooten, WEJ;
    In Proceedings - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems,
    pp. 1-8, 2014.

  63. Photodegradation of bisphenol A polycarbonate under blue light radiation and its effect on optical properties
    Maryam Yazdan Mehr; W. D. van Driel; K. M. B. Jansen; P. Deeben; M. Boutelje; GuoQi Zhang;
    Optical Materials,
    Volume 35, pp. 504-508, 2013.

  64. An approach to �Design for Reliability� in solid state lighting systems at high temperatures
    S. Tarashioon; A. Baiano; H. van Zeijl; C. Guo; S.W. Koh; W.D. van Driel; GuoQi Zhang;
    Microelectronics Reliability,
    Volume 52, Issue 5, pp. 783-793, May 2012. DOI 10.1016/j.microrel.2011.06.029.

  65. Establishment of the coarse grained parameters for epoxy-copper interfacial separation
    C.K.Y. Wong; S.Y.Y. Leung; R.H. Poelma; K.M.B. Jansen; C.C.A. Yuan; W.D. van Driel; GuoQi Zhang;
    Journal of Applied Physics,
    Volume 111, Issue 9, pp. 094906/1-094906, May 2012. DOI 10.1063/1.4712060.

  66. Diagnosing lumen depreciation in LED lighting systems: An estimation approach
    J. Dong; A. Pandharipande; W. van Driel; GuoQi Zhang;
    IEEE Transactions on Signal Processing,
    Volume 60, Issue 7, pp. 3796-3808, Jul. 2012. DOI 10.1109/TSP.2012.2192114.

  67. Solid State Lighting Reliability: Components to Systems
    W.D. van Driel; X.J. Fan;
    Springer, , Aug. 2012. DOI 10.1007/978-1-4614-3067-4.

  68. Semi empirical low cycle fatigue crack growth analysis of nanostructure chip-to-package copper interconnect using molecular simulation
    S. Koh; A. Saxena; W.D. van Driel; GuoQi Zhang; R. Tummala;
    In Molecular Modeling and Multiscaling for Electronic Material Applications,
    Springer, 2012. DOI 10.1007/978-1-4614-1728-6_5.

  69. MEMS accelerometers and their bio-applications
    M. Trifunovic; A.M. Vadiraj; W.D. van Driel;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, Apr. 2012. DOI 10.1109/ESimE.2012.6191749.

  70. Modeling lead free solder reliability in SSL applications towards virtual design
    R. Kregting; M. Erinc; J. Kloosterman; W.D. van Driel;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, pp. 1-6, Apr. 2012. DOI 10.1109/ESimE.2012.6191755.

  71. Thermal and moisture degradation in SSL system
    S. Koh; W.D. van Driel; GuoQi Zhang;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, pp. 1-6, Apr. 2012. DOI 10.1109/ESimE.2012.6191806.

  72. System approach for reliability of low-power power electronics: How to break down into their constructed parts
    S. Tarashioon; W.D. van Driel; GuoQi Zhang;
    In 7th International Conference on Integrated Power Electronics Systems (CIPS 2012),
    Nuremberg, Germany, pp. 1-5, Mar. 2012.

  73. Establishment of the mesoscale parameters for epoxy-copper interfacial separation
    C.K.Y. Wong; S.Y.Y. Leung; R.H. Poelma; K.M.B. Jansen; C.C.A. Yuan; W.D. van Driel; GuoQi Zhang;
    In 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2012),
    Lisbon, Portugal, Apr. 2012. DOI 10.1109/ESimE.2012.6191737.

  74. Co-design of wafer level thin film package assembly
    J.J.M. Zaal; F. Santagata; W.D. van Driel; GuoQi Zhang; J.F. Creemer; P.M. Sarro;
    In 12th Internat. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2011),
    Linz, Austria, pp. 1-6, Apr. 2011. ISBN 978-1-4577-0106-1.
    document

  75. Degradation of epoxy lens materials in LED systems
    S. Koh; W.D. van Driel; GuoQi Zhang;
    In 12th Internat. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2011),
    Linz, Austria, pp. 1-5, Apr. 2011. ISBN 978-1-4577-0106-1; DOI 10.1109/ESIME.2011.5765850.

  76. Molecular Dynamics study of the traction-displacement relations of epoxy-copper interfaces
    C.K.Y. Wong; S.Y.Y. Leung; R.H. Poelma; K.M.B. Jansen; C.A. Yuan; W.D. van Driel; GuoQi Zhang;
    In 12th Internat. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments Microelectronics and Microsystems (EuroSimE 2011),
    Linz, Austria, pp. 1-5, Apr. 2011. ISBN 978-1-4577-0106-1; DOI 10.1109/ESIME.2011.5765785.

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