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Electronic Components, Technology and Materials

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Electronic Components, Technology and Materials
Department of Microelectronics
  • TU Delft
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  • MSc Students

Jinglin Li

Investigating and modelling the threshold voltage stability of SiC

MSc thesis: Threshold instability and trap modelling in SiC MOS capacitor
Advisor(s): Sten Vollebregt, Joost Romijn, Yaqian Zhang

Program: MSc Microelectronics

Jinglin Li, MSc

Electronic Components, Technology and Materials

TU Delft
Fac. EEMCS
Mekelweg 4
2628 CD Delft

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