Electronic Components, Technology and Materials

Department of Microelectronics

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PhD Thesis Defence

Upcoming

12 Nov 2025

Multiscale Experimental Investigation of Electromigration Failure in Al & Cu Interconnects

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Agenda

Wed, 12 Nov 2025
15:00
Aula Senaatszaal

PhD Thesis Defence

Yaqian Zhang

Multiscale Experimental Investigation of Electromigration Failure in Al & Cu Interconnects