MSc Jinglin Li
PhD student
Electronic Components, Technology and Materials (ECTM), Department of Microelectronics
Electronic Components, Technology and Materials (ECTM), Department of Microelectronics
Biography
Jinglin obtained master degree in Microelectronics at TU Delft in 2022, and his master thesis is concerned with the physical modelling and characterisation of silicon carbide devices, especially at high temperatures.
His current research interest is wide-bandgap semiconductor physics, simulations and reliability problems.
Publications
- Temperature Sensing Elements for Harsh Environments in a 4H-SiC CMOS Technology
Jiarui Mo; Jinglin Li; Alexander May; Mathias Rommel; Sten Vollebregt; Guoqi Zhang;
IEEE Transactions on Electron Devices,
Volume 71, Issue 10, pp. 5881-5887, 2024. DOI: 10.1109/TED.2024.3450828 - A Highly Linear Temperature Sensor Operating up to 600°C in a 4H-SiC CMOS Technology
Jiarui Mo; Jinglin Li; Yaqian Zhang; Joost Romijn; Alexander May; Tobias Erlbacher; Guoqi Zhang; Sten Vollebregt;
IEEE Electron Device Letters,
Volume 44, Issue 6, pp. 995-998, 2023. DOI: 10.1109/LED.2023.3268334 - MOSFET-based And P-N Diode Based Temperature Sensors In A 4H-sSiC CMOS Technology
Jiarui Mo; Jinglin Li; Yaqian Zhang; Alexander May; Tobias Erlbacher; Guoqi Zhang; Sten Vollebregt;
In 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS 2023),
2023.
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Last updated: 1 May 2023
Jinglin Li
- +31 15 27 8
- J.Li-26@tudelft.nl
- Room: LB 01.430
- List of publications