Manual probe station w. HP4156C
Topic: Probe stations for wafer-scale and single die DC measurements
Manual probe station with 4 probe needles and HP4145 semiconductor parameter analyzer. For quick measurements or probing chips which do not fit into the cascade probe stations.
Repository data
| Type: | lab infrastructure |
|---|---|
| Date: | April 2020 |
| Contact: | Sten Vollebregt |