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Electronic Components, Technology and Materials

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Electronic Components, Technology and Materials
Department of Microelectronics
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Repository

GeneralProbe stations for wafer-scale and single die DC measurements Special (sensor) characterization setups Micro/Nano System Integration and ReliabilityReliability measurement setups

Reliability measurement setups

Contact: Sten Vollebregt

Setups to study and/or test the reliability of (packaged) chips and devices under various conditions.

Items under this topic

Temperature Test Chamber 1

Lab infrastructure, Jun 2020

Temperature Test Chamber 2

Lab infrastructure, Jun 2020

Electronic Components, Technology and Materials

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Fac. EEMCS
Mekelweg 4
2628 CD Delft

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