Special (sensor) characterization setups
Contact: Sten Vollebregt
Dedicated permanent setups for measuring (packaged) chips under environmental conditions that cannot be provided by the wafer probe stations. We have setups for controlling temperature, pressure and UV.Items under this topic
Nextron micro probe station 2Lab infrastructure, Nov 2023 |
Gas sensor test setupLab infrastructure, Oct 2022 |
FEI XL30 SFEG SEMXL30 scanning electron microscope with various detectorsLab infrastructure, Dec 2021 |
Nextron micro probe station 1Lab infrastructure, May 2020 |
Reconfigurable measurement setupLab infrastructure, May 2020 |
